Wafer Probing Station

 

Device Characterization at the Semiconductor Wafer Level






Video Copyright© Compound Semiconductor Applications (CSA) Catapult

The video explains benefits such as improving the yield of devices & optimising wafer level growth when characterising semiconductor here devices at the wafer level.
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15

Comments on “Wafer Probing Station”

Leave a Reply

Gravatar